Automotive manufacturers have invested heavily in hardware-in-the-loop (HIL) environments and built extensive libraries of plant models, restbus configurations, and test cases. However, when validation moves to software-in-the-loop (SIL) environments, these artifacts often have to be recreated for virtual testing. This duplication increases engineering effort, introduces inconsistencies, and slows down validation activities.

At the same time, automotive software is becoming increasingly complex while development cycles continue to shorten. As a result, OEMs are looking for more efficient ways to use existing validation artifacts across SIL and HIL environments. The dSPACE tool chain supports this approach by enabling the reuse of models, communication setups, ECU artifacts, and test projects across both environments.

What roles do SIL and HIL play in the validation workflow?

SIL and HIL are complementary validation approaches used at different stages of development. While SIL supports early and scalable testing in a virtual environment, HIL validates software behavior on real ECU hardware under realistic operating conditions.

SIL helps teams:

  • Start validation earlier
  • Automate regression testing
  • Debug and iterate quickly
  • Execute tests at scale

HIL helps teams:

  • Validate real-time behavior
  • Verify timing-critical functions
  • Test with physical interfaces and hardware

Talk to our experts about streamlining your validation process.

Why should OEMs reuse HIL test artifacts in SIL instead of rebuilding them?

SIL and HIL serve complementary roles in the validation workflow, which often requires teams to perform similar validation activities across both environments. As a result, OEMs are increasingly looking for ways to reuse validation artifacts across SIL and HIL.

OEMs do not want two sets of tests, two sets of models, or two sets of scenarios. They want one set of validation artifacts that works across multiple environments. Reuse brings several advantages:

  • Earlier testing: Test sequences originally meant for HIL can run in SIL before any hardware exists, so teams catch bugs earlier.
  • Less pressure on HIL benches: If SIL can run a significant share of the workload, HIL is freed up for final integration and timing-critical checks.
  • True CI/CT for automotive: SIL runs on regular PCs, so it fits into overnight builds and automated pipelines.
  • Consistent coverage: When both HIL and SIL use the same artifacts and scenarios, failures show up earlier and are easier to reproduce.
  • Lower development costs: Engineers do not have to write the same test scripts twice and do not  need to redo work that already exists.

How does dSPACE enable reuse of HIL artifacts in SIL?

By keeping models, communication setups, ECU artifacts, and test projects compatible across both environments, dSPACE enables teams to reuse existing HIL artifacts in SIL with minimal rework. This helps reduce duplicate engineering effort, maintain consistency across validation stages, and support earlier and more scalable testing.

HIL-to-SIL reuse typically focuses on five key areas:

  • Plant models
  • Network and restbus configurations
  • Artifacts and V-ECUs
  • Integrating platforms
  • Test automation projects
  • Scalable simulation execution

The following sections explain how each of these elements can be transferred from HIL to SIL within the dSPACE tool chain.

What are the practical benefits of HIL-to-SIL reuse?

Reusing validation artifacts across HIL and SIL environments helps OEMs reduce duplicate engineering effort and establish more consistent validation workflows. Instead of maintaining separate models, configurations, and test projects, teams can leverage existing artifacts across multiple development stages.

This approach enables earlier software validation, faster regression testing, improved utilization of physical HIL resources, and better support for automated CI/CD processes. By combining reusable artifacts with a common tool chain, development teams can scale validation activities more efficiently while maintaining consistency between virtual and hardware-based testing.

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About the Authors

Yogesh Tulshiram Bhoi

Yogesh Tulshiram Bhoi

Field Application Engineer, dSPACE India Solutions Pvt. Ltd.

Sajith Painadiyil Surendran

Sajith Painadiyil Surendran

Portfolio Manager SDV, dSPACE GmbH

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