Target separation is a key specification of automotive radar sensors. Validating the separation of targets is a particularly challenging task for ultrahigh-resolution imaging radars. The dSPACE Automotive Radar Test System (DARTS) 9040-GT optimally addresses this test case: The DARTS 9040-GT enables the simulation of two targets with high precision and high resolution over an instantaneous bandwidth covering the entire 5 GHz of the automotive E-band.
The dSPACE Automotive Radar Test System (DARTS) 9040-GT is designed for the most demanding tasks in radar sensor and ADAS/AD development. It is based on the industry-proven radar target simulator DARTS 9040-G. Its true 5 GHz bandwidth lets you simulate radar targets for particularly demanding automotive E-band radar sensors, such as imaging and 4-D radars. It supports target separation testing by synchronously simulating two radar targets. The two full-featured targets can be simulated with one front end (same angle of arrival) or split between two front ends (different angles of arrival). You can easily switch between the two methods to perform angular separation and range separation tests seamlessly in one setup.Due to its convenient over-the-air approach, the system can be used in all major development phases, from chip design to sensor development and end-of-line testing. It is ideal for testing entire advanced driver assistance systems and autonomous vehicles. The tests can be performed during development, production, quality assurance, and approval.
The DARTS 9040-GT uses technology that considerably simplifies the work process. For example, it is designed to instantly cover the entire 77 GHz radar band – without any synthesizer tuning. It can also stimulate short- and long-range radars without changing the center frequency.
The DARTS 9040-GT is optimized for developing complex next-generation radars. It features:
Accurate and flexible testing of automotive radar applications has never been easier. The convenient over-the-air method achieves an unmatched test depth and test coverage – supporting all development phases from chip design to vehicle end-of-line testing.
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