High Voltage, Low Risk

作者(们):
Ying Jiang (JEE), 
Ci Zhang (JEE), 
已出版: dSPACE Magazine 2/2020, Nov 2020

Modern electric drives combine high power with perfect control, down to the microsecond. In the development of today’s drives, manufacturers depend on efficient platforms that release these high powers while ensuring operational reliability. To achieve this, JEE uses hardware-in-the-loop (HIL) testing with powerful software modeling and SCALEXIO hardware from dSPACE.



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