Closed-Loop Tests of Embedded Systems with the MicroLabBox II

Simple hardware/software integration tests directly at the developer’s workstation

Paderborn, March 10, 2025. dSPACE is presenting new applications for the MicroLabBox II at embedded world 2025 (March 11-13, Nuremberg) and showing how the compact development and test system can be used for controller hardware-in-the-loop (C-HIL) tests.

Complex closed-loop test solutions are often used for testing embedded systems during development. For this reason, HIL tests have generally only been used in the late stages of the development process up to now. With the MicroLabBox II, dSPACE offers a cost-effective and at the same time very flexible entry-level system for closed-loop tests at the controller level (C-HIL). In addition to a large number of I/O interfaces, the system also offers support for automotive communication protocols, excellent real-time performance, and the ability to integrate high-precision simulation models using the large customer-programmable FPGA. 

"With the new compact HIL system, hardware-software integration tests can now be carried out in the early phases directly at the developer's workstation," explains Christian Wördehoff, Product at dSPACE.

The MicroLabBox II is ideal for testing tasks in the field of electrification, such as validating the controls of electric drives, power electronics, or charging protocols. The system addresses closed-loop test applications in various industries – from automotive engineering and agricultural engineering to robotics, medical engineering, and industrial automation.  

dSPACE is showing the MicroLabBox II and various C-HIL test fuse options in hall 4 at booth 327. The focus of dSPACE's trade fair appearance is on SIL-HIL consistency. dSPACE is presenting how software for electric, autonomous, and software-defined vehicles can be efficiently tested with consistent software-in-the-loop (SIL) and hardware-in-the-loop (HIL) solutions for simulation and validation.