Increasing the Efficiency of SIL and HIL Tests by Using a Central Data Management System

作者(们):
Andreas Himmler (dSPACE GmbH), 
Sören Reglitz (dSPACE GmbH), 
Jann-Eve Stavesand (dSPACE GmbH), 
客户公司: dSPACE GmbH, Germany
已出版: ETTC 2017 (European Test & Telemetry Conference), Jun 2017

The paper focuses on the development and test process of E/E systems. It demonstrates current challenges of handling workflow artefacts, which often originate from previous development and test steps. It also introduces commonly used test environments and explains their suitability with regard to specific test objects, objectives, and phases. Lastly, it demonstrates how a central data management tool contributes to efficiently handling all test process-related artefacts by enabling full traceability, reusability, and automatic test configuration.



  • 英語: Increasing the Efficiency of SIL and HIL Tests by Using a Central Data Management System PDF, 431 KB

推动创新进程。我们始终在技术开发的最前沿。

欢迎订阅我们简讯,了解我们的专业技术以及产品。希望我们的成功案例能够对您有所帮助。快速了解仿真和验证的最新信息。欢迎订阅/管理dSPACE简讯和dSPACE航空速报。

Enable form call

At this point, an input form from Click Dimensions is integrated. This enables us to process your newsletter subscription. The form is currently hidden due to your privacy settings for our website.

External input form

By activating the input form, you consent to personal data being transmitted to Click Dimensions within the EU, in the USA, Canada or Australia. More on this in our privacy policy.