Increasing the Efficiency of SIL and HIL Tests by Using a Central Data Management System

筆者:
Andreas Himmler (dSPACE GmbH), 
Sören Reglitz (dSPACE GmbH), 
Jann-Eve Stavesand (dSPACE GmbH), 
お客様の会社名: dSPACE GmbH, Germany
発行日: ETTC 2017 (European Test & Telemetry Conference), Jun 2017

The paper focuses on the development and test process of E/E systems. It demonstrates current challenges of handling workflow artefacts, which often originate from previous development and test steps. It also introduces commonly used test environments and explains their suitability with regard to specific test objects, objectives, and phases. Lastly, it demonstrates how a central data management tool contributes to efficiently handling all test process-related artefacts by enabling full traceability, reusability, and automatic test configuration.



  • 英語: Increasing the Efficiency of SIL and HIL Tests by Using a Central Data Management System PDF, 431 KB
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