The precise testing of radar sensors and applications is a critical requirement in development, production, quality assurance, and maintenance. The dSPACE Automotive Radar Test System (DARTS) 9020-S enables easy-to-use but very realistic over-the-air tests. This is done by simulating radar echoes of objects in road traffic with programmable distance, speed, and size.
The dSPACE Automotive Radar Test System (DARTS) 9020-S is based on industry-proven radar echo technology for testing radar sensors used in civilian vehicles. It supports clearly definable, reproducible test scenarios in the laboratory. The radar test system is based on a modular and scalable approach: Multiple units can be combined to simulate the reflections of as many objects as required for road traffic. Simulations can be performed at different distances, speeds, and sizes in real-time. With these features, the DARTS 9020-S plays a crucial role in validating radar-based automotive applications. It covers all important radar sensor development steps: from chip design to sensor development and the testing of entire advanced driver assistance systems and autonomous vehicles. The tests can be performed during development, production, quality assurance, and approval.
Thanks to its scalability, DARTS 9020-S can efficiently cover complex and demanding simulation scenarios. Its RF performance allows for an exceptionally short minimum distance. The product is conveniently operated from a host PC. Remote control interfaces ensure integration into test automation systems, making it the perfect choice for performing efficient, reproducible, and highly accurate over-the-air tests with radar sensors. Moreover, DARTS 9020-S is built with industry-proven technology that provides perfect signal resolution, precise range and speed simulation, and makes it possible to precisely define the size of objects. Accurate, simplified, and flexible testing of automotive radar applications has never been easier. The convenient over-the-air method leads to an unmatched test depth and test coverage – supporting all areas from chip design to end of line testing.
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